Parallel Test Generation for Combinatorial Models Based on Multivalued Decision Diagrams (IWCT 2022 - 11th International Workshop on Combinatorial Testing) - ICST 2022

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Mon 4 - Fri 8 April 2022

Who

Andrea Bombarda, Angelo Gargantini

Track

Time Zone

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When

Mon 4 Apr 2022 13:25 - 13:50 at Grace Hopper - IWCT Tool Competition

Andrea Bombarda

University of Bergamo

Italy

Angelo Gargantini

University of Bergamo

Italy

Time Zone

The program is currently displayed in (GMT+02:00) Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna.

Use conference time zone: (GMT+02:00) Amsterdam, Berlin, Bern, Rome, Stockholm, ViennaSelect other time zone

The GMT offsets shown reflect the offsets at the moment of the conference.

Time Band

By setting a time band, the program will dim events that are outside this time window. This is useful for (virtual) conferences with a continuous program (with repeated sessions).
The time band will also limit the events that are included in the personal iCalendar subscription service.

Display full programSpecify a time band

Session Program

Mon 4 Apr
Displayed time zone: Amsterdam, Berlin, Bern, Rome, Stockholm, Vienna change

	13:00 - 14:40	IWCT Tool CompetitionIWCT at Grace Hopper

	13:00 25m Talk		A C++ implementation of the IPO algorithm IWCT Ken'Ya Takemura Osaka University Graduate School of Information Science and Technology
	13:25 25m Talk		Parallel Test Generation for Combinatorial Models Based on Multivalued Decision Diagrams IWCT Andrea Bombarda University of Bergamo, Angelo Gargantini University of Bergamo
	13:50 25m Talk		A Constrained Covering Array Generator using Adaptive Penalty based Parallel Tabu Search IWCT yan wang Nanjing University, Huayao Wu Nanjing University, Changhai Nie Nanjing University, Xintao Niu Nanjing University, Jiaxi Xu School of Information Engineering, Nanjing Xiaozhuang University
	14:15 25m Talk		Developing multithreaded techniques and improved constraint handling for the tool CAgen IWCT Michael Wagner SBA Research, Manuel Leithner SBA Research, Dimitris Simos SBA Research, Rick Kuhn National Institute of Standards and Technology, Raghu Kacker National Institute of Standards and Technology